Markes’ experts to focus on TOF MS at forthcoming mass spectrometry conference
Monday, 18 May 2015 at 2:20:PM
Markes International’s mass spectrometry experts will be highlighting key benefits of TOF MS technologies at the 63rd ASMS conference in St Louis, MO, USA, from 31 May to 4 June.
As well as a display of equipment on Booth no. 53, three posters will be presented:
- Fast multiplexing of analytical parameters for performance improvements in time-of-flight mass spectrometry.
- Exploring the fine spectral details of aromatic species by high-definition time-of-flight mass spectrometry.
- Enhanced characterization of allergens in cosmetics by GC×GC–TOF MS with soft electron ionization.
Markes will also have a presence at the American Industrial Hygiene Conference & Exposition (AIHce) in Salt Lake City, UT, from 30 May to 4 June. Application specialists will be on hand at Booth no. 1637 to answer questions about the application of TD and TOF MS technologies to this important area.